Specialty & Electronic Gases - #153 - Trace Analysis of Helium Impurities (H2, O2, N2, CH4, CO)
#153 - Trace Analysis of Helium Impurities (H2, O2, N2, CH4, CO)
The GOW-MAC Series 590 System I Gas Chromatograph with our patented* Discharge Ionization Detector (DID) can successfully be used for trace gas analysis of helium impurities in the part-per-billion range.
The DID is non-radioactive, universal and concentration dependent. With a dynamic linear range of 5 ppb to < 1% by volume, the DID was engineered for gas standard certification at 1 - 10 ppm levels of purity. It is suitable for applications involving industrial, hydrocarbon and
electronic gases.
