Specialty & Electronic Gases

#109 - Analysis of O₂, N₂, Kr, CH₄ and Xe
Standard specialty gas analysis systems designed for the part-per-million analysis of multi-components specialty gas mixtures. The system is based upon using either a Series 580 isothermal GC with TCD or a Series 600 temperature programmable GC with TCD and can be set for either auto or manual operation.

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#117 - Analysis of Sterilizing Gas Mixture
This is an excellent analysis for any hospital or manufacturer of products requiring sterilization.

Components are: N₂, H₂O, Freon® 12, and ethylene oxide

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#153 - Trace Analysis of Helium Impurities (H₂, O₂, N₂, CH₄, CO)
The GOW-MAC Series 590 System I Gas Chromatograph with our patented* Discharge Ionization Detector (DID) can successfully be used for trace gas analysis of helium impurities in the part-per-billion range.

The DID is non-radioactive, universal and concentration dependent. With a dynamic linear range of 5 ppb to < 1% by volume, the DID was engineered for gas standard certification at 1 - 10 ppm levels of purity. It is suitable for applications involving industrial, hydrocarbon and electronic gases.

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#154 - Trace Analysis of Helium Impurities (H₂, CH₄, CO₂)
The GOW-MAC Series 590 Gas Chromatograph with our patented* Discharge Ionization Detector (DID) can successfully be used for trace gas analysis of helium impurities in the part-per-billion range.

The DID is non-radioactive, universal and concentration dependent. With a dynamic linear range of 5 ppb to < 1% by volume, the DID was engineered for gas standard certification at 1 - 10 ppm levels of purity. It is suitable for applications involving industrial, hydrocarbon and electronic gases.

Analysis: A certified gas mixture containing 1.6 ppm H₂, 2.1 CH₄, and 2.4 ppm CO₂ was analyzed in under 4 minutes.

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#156 - Analysis of Nitrous Oxide Purity
Nitrous oxide is not only used for medical applications but is commonly used in the semiconductor and chemical industries as an oxidizer.

This analysis was performed on a GOW-MAC Series 590 Discharge Ionization Detector (DID)System III Gas Chromatograph.

The DID is non-radioactive, universal and concentration dependent. With a dynamic linear range of 5 ppb to < 1% by volume, the DID was engineered for gas standard certification at 1 - 10 ppm levels of purity. It is suitable for applications involving industrial, hydrocarbon and electronic gases.

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#157 - Impurities in Ethylene (polymer grade)
As a raw material with several uses, ethylene purity has become an important issue with its' producers, the petrochemical industry, and that industry's customers. The GOW-MAC Series 590 System III Discharge Ionization Detector (DID) GC is in use in the industry analyzing ethylene for trace impurities of inorganic as well as organic gases.

The analysis is performed on a GOW-MAC Series 590 System III DID Gas Chromatograph. Impurities detected include O₂, N₂, H₂, and CH₄.

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#159 - 6 ppm Analysis of Argon in Nitrogen
Welding supply and specialty gas distributors have recently found it necessary to do their own testing and certification on the gases they provide to their customers. The GOW-MAC Series 580 Gas Chromatograph with our patented* Discharge Ionization Detector (DID) is successfully being used to analyze the impurities in bulk gases to the low parts per million level.

The DID is non-radioactive, universal and concentration dependent. With a dynamic linear range of 5 ppb to < 1% by volume, the DID was engineered for gas standard certification at 1 - 10 ppm levels of purity. It is suitable for applications involving industrial, hydrocarbon and electronic gases.

Analysis: A 2 cc sample containing 6 ppm argon in nitrogen was analyzed in under 11 minutes.

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#160 - < 10 ppm Analysis of Impurities in Argon
Welding supply and specialty gas distributors have recently found it necessary to do their own testing and certification on the gases they provide to their customers. The GOW-MAC Series 580 Gas Chromatograph with our patented* Discharge Ionization Detector (DID) is successfully being used to analyze the impurities in bulk gases to the low parts per million level.

The DID is non-radioactive, universal and concentration dependent. With a dynamic linear range of 5 ppb to < 1% by volume, the DID was engineered for gas standard certification at 1 - 10 ppm levels of purity. It is suitable for applications involving industrial, hydrocarbon and electronic gases.

Analysis: A 1/2 cc sample containing 11 ppm H₂, 10 ppm N₂ and 9.6 ppm CH₄ in argon was analyzed in under 11 minutes.

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#161 - 2 ppm Impurity Mix in Helium
Welding supply and specialty gas distributors have recently found it necessary to do their own testing and certification on the gases they provide to their customers. The GOW-MAC Series 580 Gas Chromatograph with our patented Discharge Ionization Detector (DID) is successfully being used to analyze the impurities in bulk gases to the low parts per million level.

Analysis: A 2 cc sample containing 1.8 ppm H₂, 2 ppm Ar, 2.2 ppm N₂, 2.2 ppm CH₄ and 2 ppm CO in helium was analyzed in under 15 minutes.

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#164 - Determination of ppm levels of CH₄, CO, and CO₂ in air, oxygen or heavy matrixes
The conventional method used for analysis of CH₄,CO,CO₂ is a gas chromatograph equipped with a catalytic methanizer, which reduces the CO and CO₂ to CH₄ in excess H₂. However, in the presence of oxygen or heavy hydrocarbons a methanizer can be damaged. Oxygen eluting onto a methanizer bed causes carbonization of the catalyst and can produce a false carbon dioxide peak. Samples containing large quantities of oxygen (99.9%) present even a greater problem. The large false carbon dioxide peak will overshadow the methane and carbon monoxide peaks. Samples containing hydrocarbons heavier than methane will contaminate the methane catalyst. Our method addresses these problems and allows the analysis of CH₄,CO, and CO₂ in the presence of oxygen or heavy hydrocarbons.

The system includes the GOW-MAC Series 816 Gas Chromatograph equipped with a Flame Ionization Detector (FID) and methanizer assembly.

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#167 - Ultra High Purity Helium Application: ppb Neon in Helium
This application uses the GOW-MAC Instrument Co. Discharge Ionization Detector (DID) with voltage tuning. The instrument is optimized to provide maximum detectability of permanent gas impurities in helium, including neon.

Analysis: The analysis was performed using a primary gas standard containing neon, hydrogen, argon, nitrogen, methane, carbon monoxide and carbon dioxide in a balance of helium. Nominal concentrations of all species were in the range of 600 - 700 ppb. The DID’s detection zone has been optimized in order to provide the maximum detectability (lowest LDL) for each species.

The Series 200 GC with DID detects trace gas impurities in the ppb range. Common detectable impurities include H₂, Ne, Ar, O₂, N₂, CH₄, CO, and CO₂. The GC is well suited for the bulk, specialty and electronic gas industries. The DID is a concentration-dependent universal detector using non-radioactive ionization dynamics to detect sample components.

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Series 580 DID GC Grade 5 Specialty Gas Applications
Grade 5 (99.999%) pure gas analyser for the determination of >= 1 ppm impurities in High Purity Gases. The Series 580 GC with DID GC is designed to accomodate a complete selection of valves for backflush, heart-cut via column switching, as well as series/bypass operations. Each system is unique depending upon the application.

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Series 590 DID GC Grade 6 Specialty Gas Applications
On-line/off-line automatic or manual Ultra High Purity Analyzer for the analysis of single digit and higher impurities in Grade 6 (99.999%) pure, specialty or electronic gases. The Series 590 DID GC is designed to accomodate a complete selection of valves for backfluch, heart-cut via column switching, as well as series/bypass operations. Each system is unique depending upon the application.

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